The NavigatorSEM-100 high-throughput field emission scanning electron microscope are used to investigate the ultrastructure of a wide range of biological tissues and cells.

Providing customized solutions for the life sciences biological imaging.

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The NavigatorSEM-100 high-throughput scanning electron microscope, with high imaging resolution and depth of field. Enabling observation and analysis on the surface morphology of various materials.

It is widely used in the morphology, interface, damage mechanism and material prediction. We are committed to help users deepen their learning and understanding the nature of materials.

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Scanning electron microscopes allows observation of the microstructure and morphology of the surface materials of semiconductor devices. Enabling real-time detection of the front structure of IC devices,

integrated circuit process analysis and the cross-sectional composite structure of the device. The direct electronic detection capability and intelligent analysis software of NavigatorSEM-100 provide valuable solutions for many different applications.

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Focus e-Beam Technology, the world-leading imaging analysis technology integrate with its own advanced algorithms.

Enable flexibility and offers customization according to user needs regardless of sample type and size. Providing solutions for various scientific fields.

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